M. Sc. Alex Martin

Alex Martin M. Sc.


  • Model-Based Systems Engineering - MBSE
  • modellbasiertes Änderungsmanagement

Lehre / Zuständigkeit

  • Sustainable Product Engineering

Bachelor- / Masterarbeiten

Aktuelle Bachelor- und Masterarbeiten finden sie hier.


A Contribution to MBSE-supported Modeling in Product-Production-CoDesign
Martin, A.; Schäfer, L.; Fründ, J.; Lützelschwab, J.; Fischer, M.; Lanza, G.; Albers, A.
2024. 2024 IEEE International Systems Conference (SysCon), 1–8, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SysCon61195.2024.10553444
Sustainable Design Evaluation – Integration of Sustainability in Product Development Processes
Reichard, J. J.; Martin, A.
2023. Proceedings of the Design Society, 3, 3275 – 3284. doi:10.1017/pds.2023.328
Implementation and Assessment of a Comprehensive Model-Based Systems Engineering Methodology with Regard to User Acceptance in Practice
Mandel, C.; Kaspar, J.; Heitmann, R.; Horstmeyer, S.; Martin, A.; Albers, A.
2023. Procedia CIRP, 119, 897 – 902. doi:10.1016/j.procir.2023.03.135
Systematics for an Integrative Modelling of Product and Production System
Schäfer, L.; Günther, M.; Martin, A.; Lüpfert, M.; Mandel, C.; Rapp, S.; Lanza, G.; Anacker, H.; Albers, A.; Köchling, D.
2023. 16th CIRP Conference on Intelligent Computation in Manufacturing Engineering (CIRP ICME 2023), 118, 104–109. doi:10.1016/j.procir.2023.06.019
Advanced Engineering Change Impact Approach (AECIA) – Towards a model-based approach for a continuous Engineering Change Management
Martin, A.; Kaspar, J.; Pfeifer, S.; Mandel, C.; Rapp, S.; Albers, A.
2023. 2022 IEEE International Symposium on Systems Engineering (ISSE), 1–7, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/ISSE54508.2022.10005534
Towards a System of Systems Engineering Architecture Framework
Mandel, C.; Guenther, M.; Martin, A.; Windisch, E.; Bursac, N.; Rapp, S.; Anacker, H.; Albers, A.
2022. 17th Annual System of Systems Engineering Conference (SOSE), Rochester, NY, USA, 07-11 June 2022, 221–226, Institute of Electrical and Electronics Engineers (IEEE). doi:10.1109/SOSE55472.2022.9812634